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LEADER 00000cam a2200625Mi 4500
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020 9781482236118|q(electronic bk.)
020 1482236117|q(electronic bk.)
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035 (OCoLC)958799784|z(OCoLC)963347615|z(OCoLC)964569183
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049 INap
082 04 681.25
082 04 681.25
100 1 Sirohi, R. S.
245 10 Introduction to optical metrology /|cRajpal S. Sirohi,
Tezpur University, India.
246 30 Optical metrology
264 1 Boca Raton :|bCRC Press, Taylor & Francis Group,|c[2016]
300 1 online resource :|btext file, PDF.
336 text|btxt|2rdacontent
337 computer|bc|2rdamedia
338 online resource|bcr|2rdacarrier
490 1 Optical sciences and applications of light
504 Includes bibliographical references and index.
505 00 Machine generated contents note:|g1.1.|tIntroduction --
|g1.2.|tLaw of Reflection --|g1.3.|tLaw of Refraction --
|g1.4.|tInterference --|g1.5.|tDiffraction --|g1.5.1.
|tPropagation of a Monochromatic Wave --|g1.5.2.
|tKirchhoff Theory of Diffraction --|g1.5.3.|tSmall Angle
Approximation --|g1.5.4.|tFresnel Approximation --|g1.5.5.
|tFraunhofer Approximation --|g1.6.|tPolarization --
|g1.6.1.|tPolarization Ellipse --|g1.6.2.|tRepresentation
of Polarization --|g1.6.2.1.|tJones Vector --|g1.6.2.2.
|tStokes Vector --|g1.7.|tFresnel Equations --|g1.8.|tThin
Film Optics --|g1.9.|tOptical Components --|g1.9.1.
|tReflective Components --|g1.9.1.1.|tMirror --|g1.9.2.
|tRefractive Components --|g1.9.2.1.|tRefraction at
Dielectric Interface --|g1.9.3.|tDiffractive Components --
|g1.10.|tRefraction at Curved Interface --|g1.10.1.
|tLenses --|g1.11.|tParaxial Optics --|g1.11.1.
|tTranslation Matrix --|g1.11.2.|tRefraction Matrix --
|g1.11.2.1.|tPlane Dielectric Interface --|g1.11.2.2.
|tSpherical Dielectric Interface --|g1.11.3.|tMatrix for a
Thin Lens --|tProblems --|g2.1.|tGaussian Beams --|g2.2.
|tThe ABCD Law for Gaussian Beams --|g2.2.1.|tFree Space
Propagation --|g2.2.2.|tPropagation through a Lens --
|g2.2.2.1.|tBeam Waist Lies at Plane 1 at the Lens --
|g2.2.2.2.|tBeam Waist Lies in Front of the Lens --
|g2.2.2.3.|tBeam Focusing --|g2.3.|tLaser Collimator --
|g2.4.|tVortex Beams --|g2.5.|tBessel Beams --|tProblems -
-|g3.1.|tIntroduction --|g3.2.|tRadiometric Units --|g3.3.
|tBlackbody --|g3.4.|tLight Sources --|g3.4.1.
|tIncandescent Tungsten Lamps --|g3.4.2.|tTungsten-Halogen
Lamps --|g3.4.3.|tDischarge Lamps --|g3.4.4.|tCoherent
Sources --|g3.4.4.1.|tHelium-Neon Laser --|g3.4.4.2.
|tArgon Ion Laser --|g3.4.4.3.|tNd:YAG/Nd:Glass Laser --
|g3.4.4.4.|tSemiconductor Lasers --|g3.5.|tDetectors --
|g3.5.1.|tEye --|g3.5.2.|tPhotoelectric Detectors --
|g3.5.2.1.|tPhotoemis sive Detectors --|g3.5.2.2.
|tPhotomultipliers --|g3.5.2.3.|tPhotoconductive Detectors
--|g3.5.2.4.|tPhotovoltaic Detectors --|g3.5.2.5.
|tAvalanche Photodiode --|g3.5.3.|tThermal Detectors --
|g3.6.|tRecording Media --|g3.6.1.|tPhotographic/
Holographic Plates and Films --|g3.6.2.|tDichromated
Gelatin --|g3.6.3.|tPhotoresists --|g3.6.4.|tPhotopolymers
--|g3.6.5.|tThermoplastics --|g3.6.6.|tPhotochromics --
|g3.6.7.|tFerroelectric Crystals --|g3.7.|tImage Detectors
--|g3.7.1.|tTime Delay and Integration Mode of Operation -
-|g3.8.|tSpatial Light Modulators --|tProblems --|g4.1.
|tIntroduction --|g4.2.|tEarly History --|g4.2.1.|tArrival
of Laser --|g4.3.|tGeneration of Coherent Waves/Sources --
|g4.3.1.|tWave Front Division: Double-Slit Experiment --
|g4.3.2.|tAmplitude Division: Plane Parallel Plate --
|g4.4.|tFringe Patterns --|g4.4.1.|tInterference between
Two Plane Waves --|g4.4.2.|tInterference between Two Plane
Waves of Slightly Different Frequencies --|g4.5.|tSome
More Interferometers --|g4.5.1.|tTwo-Frequency
Interferometer --|g4.5.2.|tDoppler Interferometer --
|g4.5.3.|tCyclic Interferometer --|g4.5.4.|tShear
Interferometer --|g4.6.|tPhase Shifting --|g4.6.1.
|tTemporal Phase Shifting --|g4.6.2.|tSpatial Phase
Shifting --|tProblems --|g5.1.|tHolography and Hologram
Interferometry --|g5.1.1.|tHologram Recording --|g5.1.2.
|tReconstruction --|g5.1.3.|tIn-Line Holography --|g5.1.4.
|tOff-Axis Holography --|g5.1.4.1.|tChoice of Angle of the
Reference Wave --|g5.1.4.2.|tChoice of Intensity of the
Reference Wave --|g5.1.5.|tTypes of Holograms --|g5.1.5.1.
|tDiffraction Efficiency --|g5.1.6.|tExperimental
Arrangement --|g5.1.6.1.|tLasers --|g5.1.6.2.|tBeam
Splitters --|g5.1.6.3.|tBeam Expanders --|g5.1.6.4.
|tObject Illumination Beam --|g5.1.6.5.|tReference Beam --
|g5.1.6.6.|tAngle between Object and Reference Beams --
|g5.1.7.|tHolographic Recording Materials --|g5.1.8.
|tHolographic Interferometry --|g5.1.8.1.|tReal-Time HI --
|g5.1.8.2.|tDouble-Exposure HI --|g5.1.8.3.|tTime-Average
HI --|g5.1.8.4.|tReal-Time, Time-Average HI --|g5.1.8.5.
|tStroboscopic Illumination/Stroboscopic HI --|g5.1.9.
|tSpecial Techniques in Holographic Interferometry --
|g5.1.9.1.|tTwo-Reference Beam HI --|g5.1.9.2.|tSandwich
HI --|g5.1.9.3.|tReflection HI --|g5.1.9.4.|tHeterodyne HI
--|g5.1.10.|tHolographic Contouring/Shape Measurement --
|g5.1.10.1.|tDual-Wavelength Method --|g5.1.10.2.|tDual-
Refractive Index Method --|g5.1.10.3.|tDual-Illumination
Method --|g5.1.11.|tDigital Holography --|g5.1.11.1.
|tRecording of Digital Holograms --|g5.1.11.2.
|tReconstruction of Digital Holograms --|g5.1.12.|tDigital
Holographic Interferometry --|g5.1.13.|tFringe Formation
and Measurement of Displacement Vector --|g5.1.14.
|tLoading of the Object --|g5.2.|tSpeckle Phenomenon,
Speckle Photography, and Speckle Interferometry --|g5.2.1.
|tSpeckle Phenomenon --|g5.2.2.|tAverage Speckle Size --
|g5.2.2.1.|tObjective Speckle Pattern --|g5.2.2.2.
|tSubjective Speckle Pattern --|g5.2.3.|tRelation between
Object Displacement and Speckle Shift --|g5.2.3.1.|tIn-
Plane Displacement --|g5.2.3.2.|tOut-of-Plane Displacement
--|g5.2.3.3.|tTilt of the Object --|g5.2.4.|tSpeckle
Photography --|g5.2.5.|tMethods of Evaluation --|g5.2.5.1.
|tPoint-Wise Filtering Method --|g5.2.5.2.|tWhole-Field
Filtering --|g5.2.5.3.|tFourier Filtering Method:
Measurement of Out-of-Plane Displacement --|g5.2.6.
|tSpeckle Photography with Vibrating Objects: In-Plane
Vibration --|g5.2.7.|tSensitivity of Speckle Photography -
-|g5.2.8.|tParticle Image Velocimetry --|g5.2.9.|tWhite
Light Speckle Photography --|g5.2.10.|tShear Speckle
Photography --|g5.2.11.|tSpeckle Interferometry --
|g5.2.12.|tCorrelation Coefficient in Speckle
Interferometry --|g5.2.13.|tOut-of-Plane Speckle
Interferometer --|g5.2.14.|tIn-Plane Measurement: Duffy's
Method --|g5.2.14.1.|tFiltering --|g5.2.14.2.|tFringe
Formation --|g5.2.14.3.|tDuffy's Arrangement: Enhanced
Sensitivity --|g5.2.15.|tSpeckle Shear Interferometry --
|g5.2.15.1.|tMeaning of Shear --|g5.2.15.2.|tMethods of
Shearing --|g5.2.15.3.|tTheory of Speckle Shear
Interferometry --|g5.2.15.4.|tFringe Formation --
|g5.2.15.5.|tShear Interferometry without the Influence of
In-Plane Component --|g5.2.16.|tElectronic Speckle Pattern
Interferometry --|g5.2.16.1.|tOut-of-Plane Displacement
Measurement --|g5.2.16.2.|tIn-Plane Displacement
Measurement --|g5.2.16.3.|tVibration Analysis --
|g5.2.16.4.|tMeasurement on Small Objects --|g5.2.17.
|tShear ESPI Measurement --|g5.2.18.|tContouring in ESPI-
Shape Measurement --|g5.2.18.1.|tChange of Direction of
Illumination --|g5.2.18.2.|tChange of Wavelength --
|g5.2.18.3.|tChange of Medium Surrounding the Object --
|g5.2.18.4.|tTilt of the Object --|g5.3.|tMoire Phenomena
--|g5.3.1.|tFormation of Moire Pattern --|g5.3.1.1.|tMoire
Fringe Pattern between Two Linear Gratings --|g5.3.2.
|tMoire between Reference and Deformed Gratings --
|g5.3.2.1.|tReference and Deformed Gratings Oriented along
Y-Axis --|g5.3.2.2.|tReference Grating Inclined --
|g5.3.2.3.|tGratings with Different Periods --|g5.3.3.
|tDerivative of Distortion Function --|g5.3.4.|tMoire
Pattern with Deformed Sinusoidal Grating --|g5.3.4.1.
|tMultiplicative Moire Pattern --|g5.3.4.2.|tAdditive
Moire Pattern --|g5.3.5.|tTalbot Phenomenon --|g5.3.5.1.
|tTalbot Effect in Collimated Illumination --|g5.3.5.2.
|tCut-Off Distance --|g5.3.5.3.|tTalbot Effect in
Noncollimated Illumination --|g5.4.|tPhotoelasticity --
|g5.4.1.|tSuperposition of.
505 00 |tTwo Plane Polarized Waves --|g5.4.1.1.|tLinear
Polarization --|g5.4.1.2.|tCircular Polarization --
|g5.4.2.|tProduction of Polarized Light --|g5.4.2.1.
|tReflection --|g5.4.2.2.|tRefraction --|g5.4.2.3.|tDouble
Refraction --|g5.4.3.|tOptical Elements from Crystals --
|g5.4.3.1.|tPolarizers --|g5.4.3.2.|tPhase Plates --
|g5.4.4.|tDichroism --|g5.4.5.|tScattering --|g5.4.6.
|tMalus Law --|g5.4.7.|tStress-Optic Law --|g5.4.8.
|tStrain-Optic Law --|g5.4.9.|tMethods of Analysis --
|g5.4.9.1.|tPlane Polariscope --|g5.4.9.2.|tCircular
Polariscope --|g5.4.9.3.|tEvaluation Procedure --|g5.4.10.
|tMeasurement of Fractional Fringe Order --|g5.4.10.1.
|tTardy's Method --|g5.4.11.|tPhase Shifting --|g5.4.11.1.
|tI soclinics Computation --|g5.4.11.2.|tComputation of
Isochromatics --|g5.4.12.|tBirefringent Coating Method-
Reflection Polariscope --|g5.4.13.|tHolophotoelasticity --
|g5.4.13.1.|tSingle-Exposure Holophotoelasticity --
|g5.4.13.2.|tDouble-Exposure Holophotoelasticity --
|g5.4.14.|tThree-Dimensional Photoelasticity --|g5.4.14.1.
|tFrozen Stress Method --|g5.4.14.2.|tScattered Light
Photoelasticity --|g5.5.|tMicroscopy --|g5.5.1.|tSimple
Magnifier --|g5.5.2.|tCompound Microscope --|g5.5.3.
|tKohler Illumination --|g5.5.4.|tEmpty Magnification --
|g5.5.5.|tDepth of Field --|g5.5.6.|tDepth of Focus --
|g5.5.7.|tContrast-Enhancing Techniques --|g5.5.7.1.|tDark
Field Microscopy --|g5.5.7.2.|tRheinburg Illumination --
|g5.5.7.3.|tPhase Contrast Microscopy --|g5.5.7.4.
|tInterference Microscopy --|g5.5.7.5.|tPolarization
Microscopy --|g5.5.7.6.|tHoffman Modulation Contrast --
|g5.5.7.7.|tDifferential Interference Contrast Microscopy
--|g5.5.8.|tMetrological Microscope --|g5.5.9.|tConfocal
Scanning Optical Microscope --|tProblems --|g6.1.
|tIntroduction --|g6.2.|tSpectrometer --|g6.3.|tGoniometer
--|g6.3.1.|tMeasurement of Refractive Index of a Liquid --
|g6.3.2.|tHilger-Chance Refractometer --|g6.4.|tMethods
Based on the Measurement of Critical Angle --|g6.4.1.
|tPulfrich Refractometer --|g6.4.2.|tAbbe Refractometer --
|g6.5.|tMeasurement of Brewster Angle --|g6.6.
|tEllipsometry --|g6.6.1.|tNull Ellipsometry --|g6.6.2.
|tPhotometric Ellipsometry --|g6.6.3.|tOptical Constants
of a Sample --|g6.6.4.|tOptical Constant of a Thin Film --
|g6.7.|tSpectral Transmission Measurement --|g6.7.1.
|tRefractive Index of the Substrate --|g6.8.
|tInterferometry --|tProblems --|g7.1.|tIntroduction
505 00 Note continued:|g7.2.|tMeasurement of Radius of Curvature
--|g7.2.1.|tIndirect Method: Measurement of the Sagitta --
|g7.2.1.1.|tMechanical Spherometer --|g7.2.2.|tDirect
Methods --|g7.2.2.1.|tImage Formation --|g7.2.2.2.
|tDifferences in Conjugate Positions --|g7.2.2.3.|tOptical
Spherometer --|g7.2.2.4.|tMeasurement of Long Radius of
Curvature --|g7.2.2.5.|tCavity Method-Measurement of Long
Radius of Curvature of a Concave Surface --|g7.2.2.6.
|tMeasurement of Very Long Radii of Curvature --|g7.2.2.7.
|tRadius of Curvature with a Test Plate --|g7.2.2.8.
|tNewton's Rings Method --|g7.3.|tScanning Profilometry --
|g7.4.|tRadius of Curvature Measurement by Talbot
Interferometry --|g7.5.|tMeasurement of Focal Length --
|g7.5.1.|tFocal Length of a Thin Lens --|g7.5.1.1.|tFocal
Length by Imaging --|g7.5.1.2.|ty'/tan 0' Method --
|g7.5.1.3.|tMagnification Method --|g7.5.1.4.|tFocal
Length of a Negative/Diverging Lens --|g7.5.1.5.|tNodal
Slide Method --|g7.5.1.6.|tFocal Length Measurement from
the Difference between Conjugate Positions --|g7.6.|tMoire
Deflectometry --|tProblems --|g8.1.|tTesting of a Flat
Surface --|g8.1.1.|tLiquid Surface as a Reference --
|g8.1.2.|tCalibration by Three-Flat Method --|g8.2.
|tTesting of Spherical Surfaces --|g8.2.1.|tScatter-Plate
Interferometer --|g8.2.2.|tPoint Diffraction
Interferometer --|g8.2.3.|tLaser Unequal Path
Interferometer --|g8.2.4.|tFizeau Interferometer --
|g8.2.5.|tShack Cube Interferometer --|g8.3.|tTesting of
Aspherical Surfaces --|g8.3.1.|tNull Test with a Computer-
Generated Hologram --|g8.4.|tOblique Incidence
Interferometer --|g8.5.|tShear Interferometry --|g8.6.
|tLong Wavelength Interferometry --|tProblems --|g9.1.
|tDefinition of an Angle --|g9.2.|tAutocollimator --
|g9.2.1.|tMeasurement of Angle of a Glass Wedge --|g9.2.2.
|tAngle of a Prism --|g9.2.3.|tMeasurement of Error in
90° Angle of a Right-Angle Prism --|g9.2.4.|tMeasurement
of Error in 45° Angle of a Right-Angle Prism --|g9.2.5.
|tTesting of a Pentaprism --|g9.3.|tGoniometer --|g9.3.1.
|tMeasurement of Absolute Angle --|g9.4.|tInterferometry -
-|g9.4.1.|tAngle of a Wedge Plate --|g9.4.2.|tAngle
between the Surfaces of an Opaque Plate or a Long Cylinder
/Bar --|g9.4.3.|tInterferometric Testing of Prisms --
|g9.4.3.1.|tTesting of a Right-Angle Prism --|tProblems --
|g10.1.|tTriangulation-Based Probe --|g10.2.|tSpectral
Reflectometry --|g10.3.|tEllipsometry --|g10.4.
|tInterferometry --|g10.4.1.|tFringes of Equal Chromatic
Order --|g10.4.2.|tFizeau Fringes --|g10.4.3.|tMichelson
Interferometer --|g10.4.4.|tHaidinger Fringes --|g10.5.
|tLow Coherence Interferometry --|g10.6.|tConfocal
Microscopy --|g10.7.|tLight Section Microscopy --
|tProblems --|g11.1.|tIntroduction --|g11.2.|tScattering
from a Moving Particle-Doppler Shift --|g11.2.1.
|tReference Beam Mode --|g11.2.2.|tFringe Mode --|g11.3.
|tScatter Light Beams Anemometry --|g11.4.|tMultichannel
LDA Systems --|g11.5.|tSignal Processing --|g11.6.
|tParticle Image Velocimetry --|g11.7.|tMeasurement of
Very High Velocity --|tProblems --|g12.1.|tPressure
Sensitive Paint --|g12.2.|tMeasurement of Pressure with
Photoelastic Material --|g12.3.|tRuby Pressure Standard --
|g12.4.|tFabry-Perot Etalon as Pressure Sensor --|g12.4.1.
|tFP Etalon with Flexible Mirrors --|g12.4.2.|tChange of
Refractive Index --|tProblems --|g13.1.|tIntroduction --
|g13.2.|tIntensity Modulation --|g13.2.1.|tDisplacement
Measurement: Lateral Shift between the Fibers --|g13.2.2.
|tDisplacement Sensor: Beam Attenuation --|g13.2.3.
|tProximity Probe --|g13.2.4.|tMicrobend Displacement or
Pressure Sensor --|g13.2.5.|tMeasurement of the Refractive
Index of Liquids: Fiber Optic Refractometer --|g13.3.
|tPhase Modulation --|g13.3.1.|tInterferometric Sensors --
|g13.3.1.1.|tTemperature Measurement --|g13.3.1.2.|tFiber
Optic Pressure Sensor --|g13.3.1.3.|tFiber Optic Strain
Sensor --|g13.3.1.4.|tFiber Optic Accelerometers --
|g13.3.1.5.|tFiber Optic Gyroscope or Rotation Rate
Sensors --|g13.3.1.6.|tFiber Optic Fabry-Perot
Interferometer --|g13.4.|tPressure Sensor: Membrane Type -
-|g13.4.1.|tPressure Sensor: Capillary Tip --|g13.5.
|tBragg Grating Sensors --|g13.6.|tPolarization
Maintaining Single-Mode Fibers --|g13.6.1.|tCurrent
Measurement: Faraday Rotation --|g13.7.|tFiber Optic
Biosensors --|g13.7.1.|tDirect Fiber Optic Sensors --
|g13.7.1.1.|tDirect Physical Sensors --|g13.7.1.2.|tDirect
Chemical Sensors --|g13.7.2.|tIndirect Fiber Optic Sensors
--|g13.7.2.1.|tIndirect Physical Sensors --|g13.7.2.2.
|tIndirect Chemical Sensors --|tProblems --|g14.1.
|tIntroduction --|g14.2.|tMeasurement of Gauge Blocks and
Slip Gauges --|g14.2.1.|tMethod of Exact Fractions --
|g14.3.|tGauge Block Interferometry: Comparison with a
Standard --|g14.3.1.|tSingle Wavelength Interferometry for
Gauge Blocks --|g14.4.|tComb Generation and Gauge Block
Calibration --|g14.4.1.|tMeasurement of Gauge Block with
Optical Comb --|g14.4.2.|tDistance Measurement with
Frequency Comb --|g14.5.|tModulated Frequency-Displacement
Sensor --|g14.5.1.|tFrequency-Modulated Continuous Wave
Laser Radar --|g14.6.|tDisplacement Measurement with
Interferometry --|g14.6.1.|tTwo-Frequency Laser
Interferometer for Displacement Measurement --|g14.7.
|tAngle Interferometer --|g14.8.|tMoire Technique for
Displacement Measurement --|g14.9.|tDisplacement
Distribution Measurement --|g14.9.1.|tHologram
Interferometry --|g14.9.2.|tMeasurement of Amplitude of
Vibration --|g14.9.3.|tElectronic Detection: Electronic
Speckle Pattern Interferometry/Digital Speckle Pattern
Interferometry and Speckle Photography --|g14.10.|tMoire
Techniques --|g14.10.1.|tMeasurement of In-Plane
Displacement/Deformation --|g14.10.2.|tTwo-Dimensional In-
Plane Displacement Measurement --|g14.10.3.|tHigh
Sensitivity In-Plane Displacement Measurement --|g14.10.4.
|tMeasurement of Out-of-Plane Component --|g14.10.4.1.
|tShadow Moire Method --|g14.10.4.2.|tProjection Moire --
|g14.10.5.|tMeasurement of Amplitudes of Vibration --
|g14.10.6.|tReflection Moire Method --|g14.10.7.|tSlope
Determination for Dynamic Events --|g14.11.|tDigital Image
Correlation --|tProblems.
520 3 Introduction to Optical Metrology examines the theory and
practice of various measurement methodologies utilizing
the wave nature of light. The book begins by introducing
the subject of optics, and then addresses the propagation
of laser beams through free space and optical systems.
After explaining how a Gaussian beam propagates, how to
set up a collimator to get a collimated beam for
experimentation, and how to detect and record optical
signals.
590 O'Reilly|bO'Reilly Online Learning: Academic/Public
Library Edition
650 0 Optical measurements.
650 0 Metrology.
650 0 Wave theory of light.
650 6 Mesures optiques.
650 6 Métrologie.
650 6 Théorie ondulatoire de la lumière.
650 7 Metrology|2fast
650 7 Optical measurements|2fast
650 7 Wave theory of light|2fast
776 08 |iPrint version:|z9781482236101
830 0 Optical sciences and applications of light.
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938 CRC Press|bCRCP|nCRC0KE26019PDF
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