| Description |
1 online resource : illustrations |
| Series |
Devices, circuits, and systems |
|
Devices, circuits, and systems.
|
| Bibliography |
Includes bibliographical reference and index. |
| Contents |
Chapter 1: Terrestrial Cosmic Rays and Atmospheric Radiation Background; Chapter 2: Detection and Characterization of Atmospheric Neutrons at Terrestrial Level: Neutron Monitors; Chapter 3: Natural Radioactivity of Electronic Materials; Chapter 4: Alpha-Radiation Metrology in Electronic Materials; Chapter 5: Particle Interactions with Matter and Mechanisms of Soft Errors in Semiconductor Circuits; Chapter 6: Accelerated Tests; Chapter 7: Real-Time (Life) Testing. |
|
Chapter 8: Modeling and Simulation of Single-Event Effects in Devices and CircuitsChapter 9: Soft-Error Rate (SER) Monte Carlo Simulation Codes; Chapter 10: Scaling Effects and Their Implications for Soft Errors; Chapter 11: Natural Radiation in Nonvolatile Memories: A Case Study; Chapter 12: SOI, FinFET, and Emerging Devices. |
| Summary |
This book addresses soft errors in digital integrated circuits subjected to the terrestrial natural radiation environment. It details the physical mechanisms at the origin of soft errors and explains how to detect, characterize, and simulate these phenomena in electronic circuits. |
| Subject |
Soft errors (Computer science)
|
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Atmospheric radiation.
|
|
Cosmic rays.
|
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Particles.
|
|
Erreurs temporaires (Informatique) |
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Rayonnement atmosphérique. |
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Rayonnement cosmique. |
|
Particules (Matière) |
|
Atmospheric radiation |
|
Cosmic rays |
|
Particles |
|
Soft errors (Computer science) |
| Added Author |
Munteanu, Daniela, author.
|
| Other Form: |
Print version: Soft Errors. CRC Pr I Llc 2015 9781466590830 (OCoLC)885231470 |
| ISBN |
9781466590847 (electronic bk.) |
|
146659084X (electronic bk.) |
|
1466590831 |
|
9781466590830 |
|
9781315215662 |
|
1315215667 |
|
9781351822862 |
|
1351822861 |
|
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