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Author Behl, Akhil, author.

Title CompTIA data+ DA0-001 / Akhil Behl, Siva G. Subramanian. [O'Reilly electronic resource]

Publication Info. [Indianapolis, Indiana] : Pearson Education, Inc., [2023]
To Access:
Available on O'Reilly for Public Libraries
Bookmark link: https://library.naperville-lib.org:444/record=b3193683~S1
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Description 1 online resource (1 volume.) : illustrations
Series Exam CRAM
Exam cram (Pearson Education, Inc.)
Note Includes index.
Summary CompTIA® Data+ DA0-001 Exam Cram is an all-inclusive study guide designed to help you pass the CompTIA Data+ DA0-001 exam. Prepare for test day success with complete coverage of exam objectives and topics, plus hundreds of realistic practice questions. Extensive prep tools include quizzes, Exam Alerts, and our essential last-minute review CramSheet. The powerful Pearson Test Prep practice software provides real-time assessment and feedback with two complete exams.
Subject Computing Technology Industry Association -- Examinations -- Study guides.
Computing Technology Industry Association
Electronic data processing -- Examinations -- Study guides.
Electronic data processing personnel -- Certification -- Examinations -- Study guides.
Electronic data processing -- Examinations
Examinations
Genre Study guides
Added Author Subramanian, Siva G., author.
Other Form: Print version: BEHL, AKHIL. SUBRAMANIAN, SIVA. COMPTIA DATA+ DA0-001 EXAM CRAM. [Place of publication not identified] : PEARSON, 2022 0137637292 (OCoLC)1280050633
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