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Title Digital communications test and measurement : high-speed physical layer characterization / Dennis Derickson and Marcus Müller, editors. [O'Reilly electronic resource]

Imprint Upper Saddle River, N.J. : Prentice Hall, ©2008.
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Description 1 online resource (xxxiii, 935 pages) : illustrations
Series Prentice Hall modern semiconductor design series
Prentice Hall modern semiconductor design series. Prentice Hall signal integrity library.
Bibliography Includes bibliographical references and index.
Contents Ch. 1. Fundamentals of Digital Communications Systems -- Ch. 2. Jitter Basics -- Ch. 3. Serial Communication Systems and Modulation Codes -- Ch. 4. Bit Error Ratio Testing -- Ch. 5. BERT Scan Measurements -- Ch. 6. Waveform Analysis -- Real-Time Scopes -- Ch. 7. Characterizing High-Speed Digital Communications Signals and Systems with the Equivalent-Time Sampling Oscilloscope -- Ch. 8. High-Speed Waveform Analysis Using All-Optical Sampling -- Ch. 9. Clock Synthesis, Phase Locked Loops, and Clock Recovery -- Ch. 10. Jitter Tolerance Testing -- Ch. 11. Sensitivity Testing in Optical Digital Communications -- Ch. 12. Stress Tests in High-Speed Serial Links -- Ch. 13. Measurements on Interconnects -- Ch. 14. Frequency Domain Measurements -- Ch. 15. Jitter and Signaling Testing for Chip-to-Chip Link Components and Systems -- App. A. Pseudo-Random Binary Sequences -- App. B. Passive Elements for Test Setups -- App. C. Coaxial Cables and Connectors -- App. D. Supplemental Materials for Chapter 3.
Language English.
Subject Digital communications -- Measurement.
Digital communications -- Measurement.
Digital communications -- Measurement
Added Author Derickson, Dennis.
Muller, Marcus.
Other Form: 0132209101
ISBN 9780132209106
0132209101
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