Library Hours
Monday to Friday: 9 a.m. to 9 p.m.
Saturday: 9 a.m. to 5 p.m.
Sunday: 1 p.m. to 9 p.m.
Naper Blvd. 1 p.m. to 5 p.m.
     
Limit search to available items
Results Page:  Previous Next
Author Chen, Cathy.

Title Reliable machine learning : applying SRE principles to ML in production / Cathy Chen, Niall Richard Murphy, Kranti Parisa, D. Sculley & Todd Underwood ; foreword by Sam Charrington. [O'Reilly electronic resource]

Publication Info. Sebastopol, CA : O'Reilly Media, Inc, USA, 2022.
QR Code
Description 1 online resource
Summary Whether you're part of a small startup or a multinational corporation, this practical book shows data scientists, software and site reliability engineers, product managers, and business owners how to run and establish ML reliably, effectively, and accountably within your organization. You'll gain insight into everything from how to do model monitoring in production to how to run a well-tuned model development team in a product organization. By applying an SRE mindset to machine learning, authors and engineering professionals Cathy Chen, Kranti Parisa, Niall Richard Murphy, D. Sculley, Todd Underwood, and featured guest authors show you how to run an efficient and reliable ML system. Whether you want to increase revenue, optimize decision making, solve problems, or understand and influence customer behavior, you'll learn how to perform day-to-day ML tasks while keeping the bigger picture in mind.
Subject Machine learning.
Reliability (Engineering)
Apprentissage automatique.
Fiabilité.
Machine learning
Reliability (Engineering)
Added Author Murphy, Niall Richard.
Parisa, Kranti.
Sculley, D.
Underwood, Todd.
Charrington, Sam.
Other Form: Print version: 1098106229 9781098106225 (OCoLC)1308794027
ISBN 1098106199 electronic book
9781098106195 (electronic bk.)
Patron reviews: add a review
Click for more information
EBOOK
No one has rated this material

You can...
Also...
- Find similar reads
- Add a review
- Sign-up for Newsletter
- Suggest a purchase
- Can't find what you want?
More Information