Description |
1 online resource (x, 270 pages) |
|
data file |
Bibliography |
Includes bibliographical references. |
Contents |
Front Cover; Open Systems Dependability: Dependability Engineering For Ever-changing Systems, Second Edition; Preface; Acknowledgements; Contents; Authors Per Chapter/section; Chapter 1 Introduction; Chapter 2 Open Systems Dependability; Chapter 3 The Deos Technological System; Chapter 4 D-case -building Consensus And Achieving Accountability; Chapter 5 D-case Tools; Chapter 6 D-case Integrity Checking Tool And Formal Assurance Case; Chapter 7 D-re -the Deos Runtime Environment; Chapter 8 D-script -support For System Operation Based On D-case Agreements. |
|
Chapter 9 D-add -the Agreement Description DatabaseChapter 10 Standardization Of Open Systems Dependability; Chapter 11 Conclusions; Appendix; List Of Authors; Back Cover. |
Summary |
The book describes a fundamentally new approach to software dependability, considering a software system as an ever-changing system due to changes in service objectives, users' requirements, standards and regulations, and to advances in technology. Such a system is viewed as an Open System since its functions, structures, and boundaries are constantly changing. Thus, the approach to dependability is called Open Systems Dependability. The DEOS technology realizes Open Systems Dependability. It puts more emphasis on stakeholders' agreement and accountability achievement for business/service cont. |
Subject |
Fault-tolerant computing.
|
|
Computer systems -- Reliability.
|
|
Tolérance aux fautes (Informatique) |
|
Systèmes informatiques -- Fiabilité. |
|
Computer systems -- Reliability |
|
Fault-tolerant computing |
Added Author |
Tokoro, Mario, editor.
|
Other Form: |
Print version: Tokoro, Mario. Open Systems Dependability : Dependability Engineering for Ever-Changing Systems, Second Edition. Hoboken : CRC Press, ©2015 9781498736282 |
ISBN |
9781498736299 (electronic bk.) |
|
1498736297 (electronic bk.) |
|
1498736289 |
|
9781498736282 |
Standard No. |
10.1201/b18544 doi |
|