| Description |
1 online resource (xv, 427 pages) : illustrations (chiefly color) |
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Overview of X- Ray Scattering and Diffraction Theory and Techniques -- Scattering and Diffraction Beamlines at Synchrotron Radiation Sources -- Micro- and Nanodiffraction -- Small- Angle X- Ray Scattering -- The X- Ray Standing Wave Technique: Fourier Analysis with Chemical Sensitivity -- Inelastic X- Ray Scattering from Phonons -- Magnetic X- Ray Scattering -- Nuclear Resonant Scattering of Synchrotron Radiation: Applications in Magnetism -- Reflectivity at Liquid Interfaces -- X- Ray Diffraction at Extreme Conditions: Today and Tomorrow -- Synchrotron Tomography -- Coherent X- Ray Diffraction Imaging of Nanostructures -- X- Ray Photon Correlation Spectroscopy. |
| Summary |
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. |
| Subject |
X-rays -- Diffraction.
|
|
Radiography, Industrial.
|
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Nanostructured materials -- Analysis.
|
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Rayons X -- Diffraction. |
|
Radiographie industrielle. |
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Nanomatériaux -- Analyse. |
|
x-ray diffraction. |
|
Radiography, Industrial |
|
X-rays -- Diffraction |
| Added Author |
Seeck, Oliver H., 1966- editor.
|
|
Murphy, Bridget M., 1969- editor.
|
| Other Form: |
Print version: X-ray diffraction. Singapore : Pan Stanford Publishing, [2015] 9789814303590 (OCoLC)905545858 |
| ISBN |
9789814303606 (electronic bk.) |
|
9814303607 (electronic bk.) |
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