| Description |
1 online resource (xxii, 673 pages) : illustrations |
| Bibliography |
Includes bibliographical references and index. |
| Contents |
Introduction -- Simulation -- Fault Simulation -- Automatic Test Pattern Generation -- Sequential Logic Test -- Automatic Test Equipment -- Developing a Test Strategy -- Design-For-Testability -- Built-In Self-Test -- Memory Test -- I(DDQ) -- Behavioral Test and Verification. |
| Summary |
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random defects that go undetected may result in expensive recalls and also endanger the public, since digital logic devices have become pervasive in products that affect public safety, including applications such as transportation and human implants among others. This thoroughly revised edition of the author. |
| Subject |
Digital electronics -- Testing.
|
|
Digital electronics -- Testing |
| Indexed Term |
Circuit theory and design / vlsi / ulsi Computer engineering. |
| Other Form: |
Print version: Miczo, Alexander. Digital logic testing and simulation. 2nd ed. Hoboken, NJ : Wiley-Interscience, ©2003 0471439959 (DLC) 2003041100 (OCoLC)51454559 |
| ISBN |
0471457779 (electronic bk.) |
|
9780471457770 (electronic bk.) |
|
0471439959 |
|
9780471439950 |
|
0471457787 (electronic bk.) |
|
9780471457787 (electronic bk.) |
| Standard No. |
10.1002/0471457787 doi |
|
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