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041 1  eng|hrus 
049    INap 
082 04 621.382/2 
082 04 621.382/2|223 
099    eBook O’Reilly for Public Libraries 
100 1  Brainina, Irina S. 
245 10 Applications of random process excursion analysis /|cIrina
       S. Brainina.|h[O'Reilly electronic resource] 
260    [Place of publication not identified] :|bElsevier Science 
       & Technology,|c2013. 
300    1 online resource 
336    text|btxt|2rdacontent 
337    computer|bc|2rdamedia 
338    online resource|bcr|2rdacarrier 
347    text file|2rda 
490 1  Elsevier insights 
504    Includes bibliographical references. 
505 0  1. Probability characteristics of random processes -- 2. 
       Study of informative parameters of excursions in 
       stationary random processes -- 3. Estimation of 
       distribution densities of excursion durations for random 
       stationary broadband signals -- 4. Estimating certain 
       informative parameters of random process excursions above 
       a given level -- 5. Using a family of correlation 
       functions of a clipped random process to increase the 
       accuracy of level-crossing parameters estimation -- 6. 
       Estimates obtained through the study of certain less-known
       parameters of excursions in differentiable random 
       processes -- 7. Design methodology of adaptable analyzers 
       used to measure the parameters of excursions in stationary
       random processes. 
520    This book addresses one of the key problems in signal 
       processing, the problem of identifying statistical 
       properties of excursions in a random process in order to 
       simplify the theoretical analysis and make it suitable for
       engineering applications. Precise and approximate formulas
       are explained, which are relatively simple and can be used
       for engineering applications such as the design of devices
       which can overcome the high initial uncertainty of the 
       self-training period. The information presented in the 
       monograph can be used to implement adaptive signal 
       processing devices capable of detecting or recognizing the
       wanted signals (with a priori unknown statistical 
       properties) against the background noise. The applications
       presented can be used in a wide range of fields including 
       medicine, radiolocation, telecommunications, surface 
       quality control (flaw detection), image recognition, 
       thermal noise analysis for the design of semiconductors, 
       and calculation of excessive load in mechanics. Introduces
       English-speaking students and researchers in to the 
       results obtained in the former Soviet/ Russian academic 
       institutions within last few decades. Supplies a range of 
       applications suitable for all levels from undergraduate to
       professional. Contains computer simulations. 
542    |fCopyright #169: Elsevier Science  Technology|g2013 
588 0  Print version record. 
590    O'Reilly|bO'Reilly Online Learning: Academic/Public 
       Library Edition 
650  0 Signal processing|xStatistical methods. 
650  6 Traitement du signal|xMéthodes statistiques. 
650  7 Signal processing|xStatistical methods|2fast 
776 08 |iPrint version:|z9781299733688 
830  0 Elsevier insights. 
856 40 |uhttps://ezproxy.naperville-lib.org/login?url=https://
       learning.oreilly.com/library/view/~/9780124095014/?ar
       |zAvailable on O’Reilly for Public Libraries 
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