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Author Bhattacharyya, A. B. (Amalendu Bhushan)

Title Compact MOSFET models for VLSI design / A.B. Bhattacharyya. [O'Reilly electronic resource]

Imprint Singapore ; Hoboken, NJ : John Wiley & Sons (Asia) ; [Piscataway, NJ] : IEEE Press, ©2009.
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Description 1 online resource (xxiv, 432 pages) : illustrations
Bibliography Includes bibliographical references and index.
Contents Semiconductor physics review for MOSFET modeling -- Ideal metal oxide semiconductor capacitor -- Non-ideal and non-classical MOS capacitors -- Long channel MOS transistor -- The scaled MOS transistor -- Quasistatic, non-quasistatic, and noise models -- Quantum phenomena in MOS transistors -- Non-classical MOSFET structures -- Appendix A : expression for electric field and potential variation in the semiconductor space charge under the gate -- Appendix B : features of select compact MOSFET models -- Appendix C : PSP two-point collocation method.
Summary Practicing designers, students, and educators in the semiconductor field face an ever expanding portfolio of MOSFET models. In Compact MOSFET Models for VLSI Design, A.B. Bhattacharyya presents a unified perspective on the topic, allowing the practitioner to view and interpret device phenomena concurrently using different modeling strategies. Readers will learn to link device physics with model parameters, helping to close the gap between device understanding and its use for optimal circuit performance. Bhattacharyya also lays bare the core physical concepts that will drive the future of VLSI.
Subject Integrated circuits -- Very large scale integration -- Design and construction.
Metal oxide semiconductor field-effect transistors -- Design and construction.
Integrated circuits -- Very large scale integration -- Design and construction
Metal oxide semiconductor field-effect transistors -- Design and construction
VLSI
MOS-FET
Other Form: Print version: Bhattacharyya, A.B. (Amalendu Bhushan). Compact MOSFET models for VLSI design. Singapore ; Hoboken, NJ : John Wiley & Sons (Asia) ; [Piscataway, NJ] : IEEE Press, ©2009 9780470823422 0470823429 (DLC) 2008045585 (OCoLC)226356069
ISBN 0470823437 (electronic bk.)
9780470823439 (electronic bk.)
9780470823446 (electronic bk.)
0470823445 (electronic bk.)
9786612382109
6612382104
Standard No. 10.1002/9780470823446 doi
9786612382109
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